Microscopes, components and optical measurement technology

Nikon L-200N, 1-100x, BD, Pol

Nikon wafer inspection microscope L200N (8" wafer) MBA60220, incident light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation

MBA60220 L200N STAND 100/240V

You can find more information in our product catalogue!

We use cookies on our website. Some of them are essential for the operation of the site, while others help us to improve this site and the user experience (tracking cookies). You can decide for yourself whether you want to allow cookies or not. Please note that if you reject them, you may not be able to use all the functionalities of the site.