Nikon Wafer Inspection Microscopes
Nikon LV-150N, 5-50x, BD, Pol
Part Number: L02-10550TS-0402 Nikon wafer inspection microscope LV150N (4-6" wafer) MBA61015, magnification 50-500x, high-end bright/dark field objectives and easy polarisation
Nikon LV-150N, 5-50x, BD, Pol, Cam
Part Number: L02-10550TS-0402-DDE Nikon wafer inspection microscope LV150N (4-6" wafer) MBA61015, magnification 50-500x, high-end bright/dark field objectives and easy polarisation, incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus)
Nikon LV-150N configurable
Nikon wafer inspection microscope LV150N (4-6" wafer) MBA61015, incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.
Nikon L-200N, 1-100x, BD, Pol
Nikon wafer inspection microscope L200N (8" wafer) MBA60220, incident light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation
Nikon L-200N, 1-100x, BD, Pol, Cam
Nikon wafer inspection microscope L200N (8" wafer) MBA60220, incident light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)
Nikon L-200N configurable
Nikon wafer inspection microscope L200N (8" wafer) MBA60220, incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.
Nikon L-200ND, 1-100x, BD, Pol
Nikon wafer inspection microscope L200ND (8" wafer) MBA60320, incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation
Nikon L-200ND, 1-100x, BD, Pol, Cam
Nikon wafer inspection microscope L200ND (8" wafer) MBA60320, incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of field module)
Nikon L-200ND configurable
Nikon wafer inspection microscope L200ND (8" wafer) MBA60320, incident light/transmitted light, freely configurable. Please send us a short enquiry, we will contact you shortly.
Nikon L-300N, 1-100x, BD, Pol
Nikon wafer inspection microscope L300N (12" wafer) MBA67110, incident light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation
Nikon L-300N, 1-100x, BD, Pol, Cam
Nikon wafer inspection microscope L300N (12" wafer) MBA67110, incident light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)
Nikon L-300N configurable
Nikon wafer inspection microscope L300N (12" wafer) MBA67110, incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.
Nikon L-300ND, 1-100x, BD, Pol
Nikon wafer inspection microscope L300ND (12" wafer) MBA67010, incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation
Nikon L-300ND, 1-100x, BD, Pol, Cam
Nikon wafer inspection microscope L300ND (12" wafer) MBA67010, incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)
Nikon L-300ND configurable
Nikon wafer inspection microscope L300ND (12" wafer) MBA67010, incident light/transmitted light, freely configurable. Please send us a short request, we will contact you shortly.