Microscopes and components, optical and roughness measurement technology

Results 1 - 16 of 16

Nikon Wafer Inspection Microscopes

Nikon LV-150N, 5-50x, BD, Pol

Part Number: L02-10550TS-0402 Nikon wafer inspection microscope LV150N (4-6" wafer), magnification 50-500x, high-end bright/dark field objectives and easy polarisation

Nikon LV-150N, 5-50x, BD, Pol, Cam

Part Number: L02-10550TS-0402-DDE Nikon wafer inspection microscope LV150N (4-6" wafer), magnification 50-500x, high-end bright/dark field objectives and easy polarisation, incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus)

Nikon LV-150N configurable

Nikon wafer inspection microscope LV150N (4-6" wafer), incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.

Nikon L-200N, 1-100x, BD, Pol

Nikon wafer inspection microscope L200N (8" wafer), incident light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation

Nikon L-200N, 1-100x, BD, Pol, Cam

Nikon wafer inspection microscope L200N (8" wafer), incident light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)

Nikon L-200N configurable

Nikon wafer inspection microscope L200N (8" wafer), incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.

Nikon L-200ND, 1-100x, BD, Pol

Nikon wafer inspection microscope L200ND (8" wafer), incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation

Nikon L-200ND, 1-100x, BD, Pol, Cam

Nikon wafer inspection microscope L200ND (8" wafer), incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of field module)

Nikon L-200ND configurable

Nikon wafer inspection microscope L200ND (8" wafer), incident light/transmitted light, freely configurable. Please send us a short enquiry, we will contact you shortly.

Nikon L-300N, 1-100x, BD, Pol

Nikon wafer inspection microscope L300N (12" wafer), incident light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation

Nikon L-300N, 1-100x, BD, Pol, Cam

Nikon wafer inspection microscope L300N (12" wafer), incident light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)

Nikon L-300N configurable

Nikon wafer inspection microscope L300N (12" wafer), incident light, freely configurable. Please send us a short enquiry, we will contact you shortly.

Nikon L-300ND, 1-100x, BD, Pol

Nikon wafer inspection microscope L300ND (12" wafer), incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and easy polarisation

Nikon L-300ND, 1-100x, BD, Pol, Cam

Nikon wafer inspection microscope L300ND (12" wafer), incident light/transmitted light, magnification 10-1000x, high-end bright/dark field objectives and simple polarisation incl. microscope camera 5 Mpix and microscope software NIS-Elements D with EDF (depth of focus module)

Nikon L-300ND configurable

Nikon wafer inspection microscope L300ND (12" wafer), incident light/transmitted light, freely configurable. Please send us a short request, we will contact you shortly.

Nikon NWL-200 configurable

Nikon Waferloader NWL200 in combination with a Nikon Wafer Inspection Microscope L200N freely configurable. Please send us a short request, we will contact you shortly.

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